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Research on single event transient pulse quenching effect in 90 nm CMOS technology
  • ISSN号：1674-7321
  • 期刊名称：Science China Technological Sciences
  • 时间：2011.11.11
  • 页码：3064-3069
  • 相关项目：纳米级集成电路SET软错误率分析技术研究
作者： Qin JunRui|Chen ShuMing|Liu BiWei|Chen JianJun|Liang Bin|Liu Zheng|
同期刊论文项目
纳米级集成电路SET软错误率分析技术研究
期刊论文 32 会议论文 3 专利 12
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