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A Layout-Level Approach to Evaluate and Mitigate the Sensitive Areas of Multiple SETs in Combination
  • ISSN号：1530-4388
  • 期刊名称：IEEE Transactions on Device and Materials Reliabil
  • 时间：2013.12.12
  • 页码：1-5
  • 相关项目：纳米级集成电路SET软错误率分析技术研究
作者： Du Yankang|Chen Shuming|Liu Biwei|
同期刊论文项目
纳米级集成电路SET软错误率分析技术研究
期刊论文 32 会议论文 3 专利 12
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