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Charge collection of single event effects at Bragg';s peak
  • ISSN号：1674-7348
  • 期刊名称：Science China Physics,Mechanics & Astonomy
  • 时间：2011.2.2
  • 页码：268-272
  • 相关项目：纳米级集成电路SET软错误率分析技术研究
作者： Liu Zheng|Chen ShuMing|Liang Bin|Liu BiWei|Zhao ZhenYu|
同期刊论文项目
纳米级集成电路SET软错误率分析技术研究
期刊论文 32 会议论文 3 专利 12
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