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Voltage Dependency of Propagating Single-Event Transient Pulse Widths in 90 nm CMOS Technology
  • ISSN号：1530-4388
  • 期刊名称：IEEE Transactions on Device and Materials Reliabil
  • 时间：2013.12.12
  • 页码：1-5
  • 相关项目：纳米级集成电路SET软错误率分析技术研究
作者： Qin Junrui|Chen Shuming|Liang Bin|
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纳米级集成电路SET软错误率分析技术研究
期刊论文 32 会议论文 3 专利 12
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