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Quantitative strain analysis of misfit dislocations in a Ge/Si heterostructure interface by geometri
  • ISSN号：0143-8166
  • 期刊名称：Optics and Lasers in Engineering
  • 时间：2012
  • 页码：796-799
  • 相关项目：硅锗异质结构界面纳观应变场及其对光电性能的调控
作者： Liu, Q. L.|Zhao, C. W.|Xing, Y. M.|Su, S. J.|Cheng, B. W.|
同期刊论文项目
硅锗异质结构界面纳观应变场及其对光电性能的调控
期刊论文 22 会议论文 1
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