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In-situ SEM investigation of sub-microscale deformation fields around a crack-tip in silicon
  • ISSN号：0143-8166
  • 期刊名称：Optics and Lasers in Engineering
  • 时间：2012
  • 页码：1694-1698
  • 相关项目：硅锗异质结构界面纳观应变场及其对光电性能的调控
作者： Li, J.J.|Zhao, C.W.|Xing, Y.M.|Hou, X.H.|Fan, Z.C.|Jin, Y.J.|Wang, Y.|
同期刊论文项目
硅锗异质结构界面纳观应变场及其对光电性能的调控
期刊论文 22 会议论文 1
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