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Quantitative analysis of nanoscale deformation fields of a crack-tip in single-crystal silicon
  • ISSN号：1674-7348
  • 期刊名称：Science China Physics,Mechanics & Astonomy
  • 时间：2012
  • 页码：1088-1092
  • 相关项目：硅锗异质结构界面纳观应变场及其对光电性能的调控
作者： Zhao, C.W.|Xing, Y.M.|
同期刊论文项目
硅锗异质结构界面纳观应变场及其对光电性能的调控
期刊论文 22 会议论文 1
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