采用文献(魏洪川,喻文健,杨柳,等.基于K参数思想的快速三维互连电感电阻提取算法.电子学报,2005,33(8):1365—1369)中提出的算法选取窗口,证明基于此方法提取的部分磁阻矩阵K正定,进而证明基于该矩阵的模拟稳定.
The window selection method proposed in (Wei Hongchuan, Yu Wenjian, Yang Liu, et al. Fast inductance and resistance extraction of 3-D VLSI interconnects based on the method of K element. Acta Electronica Sinica, 2005, 33(8): 1365-1369) was used in the paper. We proved based on it, the partial reluctance matrix extracted is positive definite. So the simulation based on it is stable.