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Fabrication of a novel RF switch device with high performance using In0.4Ga0.6As MOSFET technology
  • ISSN号:1674-4926
  • 期刊名称:《半导体学报:英文版》
  • 时间:0
  • 分类:TN386.1[电子电信—物理电子学] TM564[电气工程—电器]
  • 作者机构:[1]Microwave Device and IC Department, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China, [2]Guangxi Experiment Center of Information Science, Guilin University of Electronic Technology, Guilin 541004, China
  • 相关基金:Project supported by the National Natural Science Foundation of China (Nos. 61274077, 61474031), the Guangxi Natural Science Foun- dation (No. 2013GXNSFGA019003), the Guangxi Department of Education Project (No. 201202ZD041), the Guilin City Technology Bureau (Nos. 20120104-8, 20130107-4), the China Postdoctoral Science Foundation Funded Project (Nos. 2012M521127, 2013T60566), the National Basic Research Program of China (Nos. 2011CBA00605, 2010CB327501), the Innovation Project of GUET Graduate Educa- tion (Nos. GDYCSZ201448, GDYCSZ201449), the State key Laboratory of Electronic Thin Films and Integrated Devices, UESTC (No. KFJJ201205), and the Guilin City Science and Technology Development Project (Nos. 20130107-4, 20120104-8).
中文摘要:

A novel radio frequency(RF) switch device has been successfully fabricated using InGaAs metaloxide-semiconductor field-effect transistor(MOSFET) technology.The device showed drain saturation currents of 250 mA/mm,a maximum transconductance of 370 mS/mm,a turn-on resistance of 0.72 mΩ·mm2 and a drain current on-off(Ion/Ioff) ratio of 1×106.The maximum handling power of on-state of 533 mW/mm and off-state of 3667 mW/mm is obtained.The proposed In0.4Ga0.6As MOSFET RF switch showed an insertion loss of less than 1.8 dB and an isolation of better than 20 dB in the frequency range from 0.1 to 7.5 GHz.The lowest insertion loss and the highest isolation can reach 0.27 dB and more than 68 dB respectively.This study demonstrates that the InGaAs MOSFET technology has a great potential for RF switch application.

英文摘要:

A novel radio frequency (RF) switch device has been successfully fabricated using InGaAs metal- oxide-semiconductor field-effect transistor (MOSFET) technology. The device showed drain saturation currents of 250 mA/mm, a maximum transconductance of 370 mS/ram, a turn-on resistance of 0.72 mx2.mm2 and a drain current on-off (Ionloll) ratio of 1 x 106. The maximum handling power of on-state of 533 mW/mm and off-state of 3667 mW/mm is obtained. The proposed In0.4Ga0.6As MOSFET RF switch showed an insertion loss of less than 1.8 dB and an isolation of better than 20 dB in the frequency range from 0.1 to 7.5 GHz. The lowest insertion loss and the highest isolation can reach 0.27 dB and more than 68 dB respectively. This study demonstrates that the InGaAs MOSFET technology has a great potential for RF switch application.

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期刊信息
  • 《半导体学报:英文版》
  • 中国科技核心期刊
  • 主管单位:中国科学院
  • 主办单位:中国电子学会 中国科学院半导体研究所
  • 主编:李树深
  • 地址:北京912信箱
  • 邮编:100083
  • 邮箱:cjs@semi.ac.cn
  • 电话:010-82304277
  • 国际标准刊号:ISSN:1674-4926
  • 国内统一刊号:ISSN:11-5781/TN
  • 邮发代号:2-184
  • 获奖情况:
  • 90年获中科院优秀期刊二等奖,92年获国家科委、中共中央宣传部和国家新闻出版署...,97年国家科委、中共中央中宣传部和国家新出版署三等奖,中国期刊方阵“双效”期刊
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  • 被引量:7754