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Probe pressure dependence of nanoscale capacitance-voltage characteristic for AlGaN/GaN heterostruct
  • ISSN号：0034-6748
  • 期刊名称：Review of Scientific Instruments
  • 时间：2010.10.10
  • 页码：1-3
  • 相关项目：介电/半导体集成薄膜的分子束外延生长与界面控制研究
作者： Zhang, Jihua|Zeng, Huizhong|Zhang, Min|Liu, Wei|Zhou, Zuofan|Chen, Hongwei|Yang, Chuanren|Zhang, Wanli|Li, Yanrong|
同期刊论文项目
介电/半导体集成薄膜的分子束外延生长与界面控制研究
期刊论文 35 会议论文 1
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