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Quantum size impacts on the threshold voltage in nanocrystalline silicon thin film transistors
  • ISSN号：0026-2714
  • 期刊名称：Microelectronics Reliability
  • 时间：2013.12.12
  • 页码：1886-1890
  • 相关项目：纳米集成电路的量子混沌及其对电路性能的影响
作者： Mao, Ling-Feng|
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纳米集成电路的量子混沌及其对电路性能的影响
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