用熔融淬冷法制备了系列掺杂浓度的Dy3+:Ge-Ga-S-CsI硫卤玻璃样品,测试了样品拉曼光谱、折射率、吸收光谱、近红外及中红外荧光谱.应用Judd-Ofelt理论计算了Dy3+离子的强度参数(Ωi,i=2,4,6)、自发辐射跃迁概率(A)、荧光分支比(β)、以及辐射寿命(τrad)等光谱参数.研究了810nm激光抽运下样品中红外荧光特性与掺杂浓度之间变化关系,计算了常温下Dy^3+:^6H13/2→^6H15/2(2.86μm)和^6H11/2→^6H13/2(4.38μm)跃迁多声子弛豫速率(Wmp)、以及Ge-Ga-S-CsI玻璃基质中电子-声子结合常数(α).
A series of chalcogenide glasses based on Ge-Ga-S-CsI system doped with different Dy^3 + ions were synthesized by melt-quenching technique. The refractive indices,Raman spectra,absorption spectra,near-and mid-infrared fluorescence of glass samples were measured. The intensity parameters (Ωi,i = 2,4,6),transition probabilities ( A),branching ratios (β) and radiation lifetimes (τrad) have been predicted for Dy3 + ions in the samples by using the Judd-Ofelt theory. The mid-infrared fluorescence properties were investigated for different Dy3 + ion concentrations under 810 nm laser excitation. The multiphonon relaxation rates (Wmp) of Dy^3 + :^6 H 13/2→^6 H 15/2(2. 86 μm) and^6 H 11/2→6 H 13/2(4. 38 μm),and the constant related to the e-p coupling strength ( α ) of Ge-Ga-S-CsI glasses were evaluated.