通过熔融淬冷法制备了掺杂0.6%(占基质玻璃的质量分数)Er(3+):65GeS2-25Ga2S3-10CsI(摩尔比)玻璃。通过不同热处理工艺对玻璃样品进行微晶化处理获得了硫卤微晶玻璃。测试了其密度、显微硬度、红外透过光谱、以及中红外荧光光谱。对比研究了基质玻璃与微晶玻璃样品之间性能差异。结果表明:基质玻璃在热处理温度为440℃,热处理时间为14 h后,所获得的微晶玻璃样品的密度和显微硬度明显增加,中远红外透过性能并未有显著的降低,Er(3+):4I(11/2)→4I(12/2)跃迁相对应的2.8μm处的中红外荧光光强稍有增强。
0.6%(mass fraction of based glass) Er~(3+)-doped 65GeS_2-25Ga_2S_3-10CsI(molar ratio) chalcohalide glass was prepared by melt-quenching method.The corresponding glass-ceramics were obtained by heat treating the host glass.The densities,micro-hardness, infrared transmission and mid-infrared emission spectra of the samples before and after heat treatment were measured.The results show that the density and micro-hardness of the glass are significantly increases after heat treatment at 440℃for 14 h,while the infrared transmittance remains the same.The mid-infrared emission intensity at 2.8μm corresponding to electronic transitions of ~4I_(11/2)→~4I_(13/2) in Er~(3+) ions increases slightly.