用熔融法结合放电等离子烧结(SPS)合成了Yb/Sr双原子复合填充的n型YbxSr8-xGa16Ge30(x=0,0.5,1.0,1.5)笼合物,研究了双原子复合填充及Yb填充量x对YbxSr8-xGa16Ge30笼合物热电传输特性的影响规律.结果表明,Yb在YbxSr8-xGa16Ge30化合物中的固溶极限介于1.0-1.5之间.随着Yh填充量x的增加,化合物的室温载流子浓度增加而迁移率降低.在300-800K温度范围内,随着x的增加,双原子填充试样的电导率逐渐增大,Seebeck系数逐渐减小,其中x=0.5的试样与单原子填充的Sr8Ga16Ge30试样相比,电导率变化不大,Seebeck系数显著增加.Yb/Sr双原子复合填充比Sr单原子填充更有利于晶格热导率的降低,且晶格热导率随着Yb填充量x的增加逐渐降低.在所有n型YbxSr8-xGa16Ge30化合物中,YbxSr7.0Ga16Ge30化合物的ZT值最大,在800K时其最大ZT值达0.81,与单原子填充的Sr8Ga16Ge30化合物相比ZT值提高了35%.
n-type Yb/Sr double-atom-filled YbxSr8-xGa16Ge30 ( x = 0, 0.5, 1.0, 1.5) clathrates have been synthesized by combining melting reaction with the spark plasma sintering (SPS) method. The effects of double-atom filling on thermoelectric properties have been investigated. The results show that the solubility limit of Yb in the Sr-Ga-Ge system is between 1.0 and 1.5 when it is expressed by the formula of YbxSr8-xGa16Ge30. With increasing Yb content x, the room-temperature carrier concentration of the YbxSr8-xGa16Ge30 samples increases, while the room-temperature carrier mobility decreases. For the double-atom-filled samples, the electrical conductivity raises with increasing x, while the Seebeck coefficient reduces, and in which the x = 0.5 sample has a comparable electrical conductivity and a remarkably higher Seebeck coefficient compared with the single-atom-filled Sr8Ga16Ge30 sample in the temperature range of 300--800 K. The double-atom filling of Yb/Sr has significant influence on the lattice thermal conductivity of the YbxSr8-xGa16Ge30 samples and the lattice thermal conductivity decreases gradually with increasing x. Of all the YbxSr8-xGa16Ge30 samples, the maximum dimensionless figure of merit ZT of 0.81 is obtained at 800 K for the YbxSr8-xGa16Ge30 sample. Compared with that of single-atom-filled Sr8Ga6Ge30 sample, it is 35 % higher at the same temperature.