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Deteriorated radiation effects impact on the characteristics of MOS transistors with multi-finger co
  • ISSN号：0026-2714
  • 期刊名称：Microelectronics Reliability
  • 时间：0
  • 页码：1094-1097
  • 语言：英文
  • 相关项目：集成电路工艺研究（包括ＣＡＭ）
作者： Wang, Jian|Pei, Yunpeng|Xue, Shoubin|Wang, YangYuan|Wang, Wenhua|Huang, Ru|Fan, Chunhui|Wang, Xin'an|
同期刊论文项目
集成电路工艺研究（包括ＣＡＭ）
期刊论文 55 会议论文 53 获奖 2 专利 35
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