A study of cycling induced degradation mechanisms in Si nanocrystal memory devices
- 期刊名称:Nanotechnology
- 时间:0
- 页码:9582-9593
- 语言:英文
- 相关项目:复合多晶硅栅射频高增益MOSFET的研究
作者:
Wang, Q|Yang, XN|Chen, JN|Jiang, DD|Yu, ZA|Zhang, B|Wang, Y| Liu, J |Chen, JN|Zhang, MH|Huo, ZL|