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Comparative study of interfacial reactions of high-Sn lead-free solders on single crystal Cu and on
  • 所属机构名称：大连理工大学
  • 会议名称：2009 International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-H
  • 成果类型：会议
  • 会场：Beijing, China
  • 相关项目：无铅化电子封装钎焊界面反应及焊点可靠性的基础研究
作者： Huang, Mingliang|Cui, Yipeng|
同会议论文项目
无铅化电子封装钎焊界面反应及焊点可靠性的基础研究
期刊论文 44 会议论文 31
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