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Self-Heating Effect and Characteristic Variability of Gate-All-Around Silicon Nanowire Transistors f
  • 所属机构名称：北京大学
  • 会议名称：IEEE International SOI Conference
  • 成果类型：会议
  • 相关项目：集成电路工艺研究（包括ＣＡＭ）
作者： R. Huang|R.S. Wang|C. Fan|J.B. Zou|Y.Y. Wang|T. Yu| J. Zhuge|S.S. Pu|Y.J. Ai|
同会议论文项目
集成电路工艺研究（包括ＣＡＭ）
期刊论文 55 会议论文 53 获奖 2 专利 35
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