对在蓝宝石衬底上MOCVD生长的P型GaN薄膜,用能量为90keV的Mn^+离子进行室温下的磁性离子注入掺杂,注入剂量为1×10^15~5×10^16cm^-2.对注入的样品在N2气流中经800℃下0~90s时间不等的快速热退火处理.对样品的电、磁特性分析发现在注入剂量较低时(≤1×10^16cm^-2),样品中的强铁磁性对应着高电阻率,弱铁磁性对应着低电阻率;而在5×10Mcm^-2的高注入剂量下则没有这样的规律。通过对退火条件的研究,发现在800℃下退火45s的样品具有较强的铁磁性和较低的电阻率,而退火90s的样品中铁磁性减弱,电阻率升高,揭示出注入剂量和退火条件是在对P型GaN薄膜进行磁性离子注入掺杂过程中的两个重要控制参量.
The magnetic doping of wurtzite p-GaN films, which are grown on sapphire substrates by MOCVD, is achieved by 90keV Mn^+ ions implantation at room temperature. The implantation doses are set between1×10^15 and 5×10^16cm^-2. After an annealing step at 800℃ for 0~90s in flowing N2, the magnetic and electric characteristics of the implanted p-GaN films are studied. With relatively low implantation doses (≤1×10^16cm^-2), the dose dependent ferromagnetism is propositional to resistivity, i.e. the sample with strong ferromagnetism has high resistivity, while the sample with weak ferromagnetism shows low resistivity. But such regularity does not hold for p-GaN films with 5×10Mcm^-2 Mn^+-implantation. By the study of annealing conditions, it is found that the sample annealed for 45s has both strong ferromagnetism and low resistivity, while the sample annealed for 90s has decreased ferromagnetism and increased resistivity. The results reveal the remarkable influence of implantation doses and annealing conditions in the magnetic doping processes of p-GaN films by Mn^+ ions implantation.