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Numerical simulation of a P+ a-SiC:H/N+ poly-Si solar cell with high efficiency and fill factor
ISSN号:0256-307X
期刊名称:Chinese Physics Letters
时间:2012
页码:-
相关项目:基于单光子探测的微波集成电路的缺陷检测
作者:
Shao Qingyi|Chen A-qing|Zhu Kaigui|Zhang Juan|
同期刊论文项目
基于单光子探测的微波集成电路的缺陷检测
期刊论文 42
会议论文 2
同项目期刊论文
Using binary decision diagram for test generation of power supply noise in digital circuits
A novel design approach of high temperature superconducting magnets by cultural evolution algorithms
Low power test generation of digital circuits by using genetic simulated annealing for the reorderin
Defect inspection of LED chips using generalized regression neural network
An approach to generate tests for multiple victim lines of crosstalk faults in integrated circuits
Structural transition of FeSe under high pressure
Effects of nitrogen substitutional doping on the electrical properties of small radius (4,0) single-
Identify equivalent signal lines for logic verification of combinational circuits
Mapping cores to network-on-chip in digital circuit design by using Tabu search approach
Minimization of binary decision diagrams by adaptive hierarchy genetic algorithm and its application
电子束蒸发沉积TiN薄膜的电学特性研究
衬底温度对氮化锌薄膜特性的影响
射频感应耦合低压等离子体特性分析
一种基于Tent混沌系统的音频加密方法
一种基于FPGA与DSP的数字射频发射机的设计与实现
基于Deep Web Search技术的主题式爬虫模块研究与设计
基于仿生学信任信誉模型BTRM的无线传感器网络的信任协作研究与实现
基于JavaLucene的分级鉴权资源管理系统的研究与实现
A testing approach for MOS circuit using single-photon detectors under high magnetic fields
Testing of defects in Si semiconductor apparatus by using single-photon detection
Optimization of BDD by chaotic evolution algorithm and its application in test of stuck-open faults
Equivalence checking of combinational circuit using chaotic pattern simulation and binary decision d
Verifying the equivalence of combinational circuits by test pattern generation based on structure fe
Low power test pattern design for VLSI circuits using incorporate pseudorandom and deterministic app
Test pattern generation with low power for delay faults in digital circuits by evolution method with
Defect feature acquisition of LED wafer using region growing segmentation with clustering strategy
A novel defect inspection method for semiconductor wafer based on magneto-optic imaging
Test bus assignment of system on chip by using cultural particle swarm optimization
Boron/phosphorus co-doping in zigzag single-walled carbon nanotubes: A first-principles study
Determining equivalent signal lines by weight value assignment for logic verification of digital cir
数字平均对红外单光子探测器中温度控制系统信噪改善比的影响
Generation of test vectors with low power by co-evolution algorithm for digital circuits
A single-photon fault-detection method for nanocircuits that use GaN material ( 已录用)
色差图像的数字图像拼接算法
氮分压与衬底温度对光透明材料氮化锌的影响
The optimization functions of ICP discharge in preparation of Cu-Zn-Sn precursors and CZTS films by co-evaporation
磁控溅射ZnO薄膜及其微观结构与光电特性
The analytical model for crosstalk noise of current-mode signaling in coupled RLC interconnects of VLSI circuits
Structural transition of FeSe under high pressure*
Detecting the micro-defects in the GaAs materials by time resolved emissions
期刊信息
《中国物理快报:英文版》
中国科技核心期刊
主管单位:中国科学院
主办单位:中国科学院物理研究所、中国物理学会
主编:
地址:北京中关村中国科学院物理研究所内(北京603信箱《中国物理快报》编辑部)
邮编:100080
邮箱:cpl@aphy.iphy.ac.cn
电话:010-82649490 82649024
国际标准刊号:ISSN:0256-307X
国内统一刊号:ISSN:11-1959/O4
邮发代号:
获奖情况:
中国期刊方阵“双高”期刊
国内外数据库收录:
美国化学文摘(网络版),美国数学评论(网络版),荷兰文摘与引文数据库,美国剑桥科学文摘,美国科学引文索引(扩展库),英国科学文摘数据库,日本日本科学技术振兴机构数据库,中国中国科技核心期刊,英国英国皇家化学学会文摘
被引量:190