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Low power test pattern design for VLSI circuits using incorporate pseudorandom and deterministic app
  • ISSN号：1012-0394
  • 期刊名称：Solid State Phenomena
  • 时间：2012
  • 页码：229-232
  • 相关项目：基于单光子探测的微波集成电路的缺陷检测
作者： Zhongliang Pan, Ling Chen|
同期刊论文项目
基于单光子探测的微波集成电路的缺陷检测
期刊论文 42 会议论文 2
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