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Generation of test vectors with low power by co-evolution algorithm for digital circuits
  • ISSN号：1876-1100
  • 期刊名称：Lecture Notes in Electrical Engineering
  • 时间：2012
  • 页码：259-264
  • 相关项目：基于单光子探测的微波集成电路的缺陷检测
作者： Chen Ling|Pan Zhongliang|
同期刊论文项目
基于单光子探测的微波集成电路的缺陷检测
期刊论文 42 会议论文 2
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