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Test pattern generation with low power for delay faults in digital circuits by evolution method with
  • 期刊名称：Journal of Engineering Science and Technology Revi
  • 时间：0
  • 页码：-
  • 相关项目：基于单光子探测的微波集成电路的缺陷检测
作者： Pan ZhongLiang, Chen Ling|
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基于单光子探测的微波集成电路的缺陷检测
期刊论文 42 会议论文 2
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