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Optimization of BDD by chaotic evolution algorithm and its application in test of stuck-open faults
  • ISSN号：1674-7321
  • 期刊名称：Journal of Theoretical and Applied Information Tec
  • 时间：2013
  • 页码：1876-1882
  • 相关项目：基于单光子探测的微波集成电路的缺陷检测
作者： Pan Zhongliang, Chen Ling|
同期刊论文项目
基于单光子探测的微波集成电路的缺陷检测
期刊论文 42 会议论文 2
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