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Verifying the equivalence of combinational circuits by test pattern generation based on structure fe
  • 期刊名称：WIT Trans. on Information and Communication Techno
  • 时间：2014
  • 页码：1289-1297
  • 相关项目：基于单光子探测的微波集成电路的缺陷检测
作者： Pan Zhongliang, Chen Ling|
同期刊论文项目
基于单光子探测的微波集成电路的缺陷检测
期刊论文 42 会议论文 2
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