本文报道了基于混合物理化学气相沉积法(Hybrid physical-chemical vapordeposition,简称为HPCVD),以硅烷热解出的Si原子作硅源,在SiC衬底上原位生长了一系列硅掺杂MgB_2超导薄膜样品.样品中最大硅掺杂量是9%.与纯净的MgB_2薄膜相比较,掺杂样品的超导临界转变温度T_c没有大幅下降,超导临界电流J_c得到了一定提升.在温度为5K,外加垂直磁场为3T的条件下,样品的临界电流密度最大达到2.7×10~5Acm~(-2).同时上临界场H_(c2)在超导转变温度附近对于温度的变化曲线斜率—dH/dT也有一定的提高.
We report the synthesis and characterization of silicon-doped MgB_2 films fabricated by hybrid physicalchemical vapor deposition(HPCVD) using silane as the doping source.Various amounts of Si up to 9%were added into MgB_2 thin films,which are in situ epitaxial growth on SiC.Compared with the undoped film,the superconducting transition temperature(T_c) of the doped film does not change significantly,however its magnetic critical current density(J_c) has been increased.J_c of the film with 5.0 at%is up to 2.7×10~5 Acm~(-2) for 3T perpendicular field. And the slope of the upper critical field(H_(c2)) curve of the doped film is slightly higher than that for the undoped MgB_2 film.