通过真空蒸发将PTCDA淀积在p-Si(100)面。采用Raman光谱,AFM分别研究了衬底温度对于PTCDA分子结构和表面形貌的影响,进而完善了p—Si基PTCDA薄膜的生长机制。
The PTCDA films were grown on p-Si(100) by vacuum evaporation. We investigated the influence of substrate temperature on the molecule structure and surface morphology of the PTCDA by Raman and AFM, Moreover we consummated the growth mode of PTCDA on p-Si.