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门级电路自动测试向量生成技术原理
  • ISSN号:1008-9497
  • 期刊名称:《浙江大学学报:理学版》
  • 时间:0
  • 分类:TP391.76[自动化与计算机技术—计算机应用技术;自动化与计算机技术—计算机科学与技术]
  • 作者机构:[1]浙江大学信息与电子工程系,浙江杭州310028, [2]浙江大学电气学院,浙江杭州310028
  • 相关基金:国家自然科学基金资助项目(N0.90207002).
中文摘要:

集成电路的飞速发展使得测试的难度不断增加,而ATPG技术在测试向量产生方面具有重要的意义,本文对该技术的发展及其所采用的方法进行了系统地介绍和分析.针对门级的组合电路和时序电路的ATPG方法具有许多相似之处,但也同时存在各自的特点,在文中,对这两类电路的方法进行了仔细的比较、区分.

英文摘要:

With the development of integrated circuit, testing becomes more and more difficult. Automation test pattern generation (ATPG) is very important in test field. In recent years, many researchers payed attention to this topic, and improved this technology very much. In this paper, most methods and technologies about ATPG were introduced and analyzed in detail. All methods can be classified into two classes: one is based on determinate ATPG; the other is based on random-simulation ATPG. Many new methods were put forward in recent several years. All new and old methods were surveyed in the paper, and the progress process was also discussed. It is well known that sequential circuit ATPG is more difficult than combinational circuit but they have a very close relationship. The methods about combinational circuit can be applied in sequential circuit. At the same time, the APTG methods about gated combinational circuit and gated sequential circuit have many differences. All of the differences were analyzed and compared in detail in this paper.

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期刊信息
  • 《浙江大学学报:理学版》
  • 中国科技核心期刊
  • 主管单位:教育部
  • 主办单位:浙江大学
  • 主编:贺贤士 张富春
  • 地址:杭州市天目山路148号
  • 邮编:310028
  • 邮箱:zdxb_l@zju.edu.cn
  • 电话:0571-88272803
  • 国际标准刊号:ISSN:1008-9497
  • 国内统一刊号:ISSN:33-1246/N
  • 邮发代号:32-36
  • 获奖情况:
  • 第二届中国高校精品科技期刊
  • 国内外数据库收录:
  • 俄罗斯文摘杂志,美国化学文摘(网络版),美国数学评论(网络版),英国农业与生物科学研究中心文摘,波兰哥白尼索引,德国数学文摘,荷兰文摘与引文数据库,美国剑桥科学文摘,英国动物学记录,中国中国科技核心期刊,中国北大核心期刊(2004版),中国北大核心期刊(2008版),中国北大核心期刊(2014版)
  • 被引量:7855