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中文摘要：
A semi-empirical detector response function(DRF)model is established to fit characteristic X-ray peaks recorded in Si-PIN spectra,which is mainly composed of four components:a truncated step function,a Gaussian-shaped full-energy peak,a Gaussian-shaped Si escape peak and an exponential tail.A simple but useful statistical distribution-based analytic method(SDA)is proposed to achieve accurate values of standard deviation for characteristic X-ray peaks.And the values of the model parameters except for the standard deviation are obtained by weighted least-squares fitting of the pulse-height spectra from a number of pure-element samples.A Monte Carlo model is also established to simulate the X-ray measurement setup.The simulated flux spectrum can be transformed by Si-PIN detector response function to real pulse height spectrum as studied in this work.Finally,the fitting result for a copper alloy sample was compared with experimental spectra,and the validity of the present method was demonstrated.更多还原
英文摘要：
A semi-empirical detector response function （DRF） model is established to fit characteristic X-ray peaks recorded in Si-PIN spectra, which is mainly composed of four components： a truncated step function, a Gaussian-shaped full-energy peak, a Gaussian-shaped Si escape peak and an exponential tail. A simple but useful statistical distribution-based analytic method （SDA） is proposed to achieve accurate values of standard deviation for characteristic X-ray peaks. And the values of the model parameters except for the standard deviation are obtained by weighted least-squares fitting of the pulse-height spectra from a number of pure-element samples. A Monte Carlo model is also established to simulate the X-ray measurement setup. The simulated flux spectrum can be transformed by Si-PIN detector response function to real pulse height spectrum as studied in this work. Finally, the fitting result for a copper alloy sample was compared with experimental spectra, and the validity of the present method was demonstrated.
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