研究了冲击老化过程中温度对压敏电压和泄漏电流的影响。研究表明,压敏电压呈现弱的负温度特性。随着冲击次数增加,压敏电压与温度的相关性有增强趋势,而且压敏电压随温度变化的波动变得明显。泄漏电流受温度影响较大。随着温度上升。泄漏电流呈指数函数上升,具有较强的正温度特性,且随着冲击次数增加,正温度特性越强。
The effect of temperature on the breakdown voltage and leakage current during the process of impulse degradation has been studied. The study shows that the voltage has weak negative temperature characteristic. With the increase of the impulse times, the correlation has an increase trend, and the fluctuation of voltage variation with temperature becomes obvious. The leakage currents and environmental temperature have a strong correlation. With the increase of the temperature, the leakage current increases exponentially, and with the increase of the impulse times, the positive temperature characteristic is obvious.