超分辨近场结构(super-RENs)技术通过在传统光盘结构中插入掩膜结构而实现近场超分辨,是目前最具实用化前景的超高密度光存储技术之一,其中掩膜层的近场光学特性是决定其光存储性能的关键。利用三维时域有限差分法(3D-FDTD)对合金掩膜的近场光强分布进行了数值仿真和分析,提出二元共晶合金薄膜在激光作用下形成的规则微结构可能是以其作为掩膜层的超分辨近场结构光盘产生较高信噪比(SNR)的原因。
Super resolution near-field structure (super-RENS) is one of the most promising candidates for the ultrahigh-density optical storage, and near-field optical properties of the mask layer in super-RENS optical disk are crucial for its optical storage performance. The near-field distribution through the eutectic alloy mask layer has been studied by using three-dimensional finite-difference time-domain (3D-FDTD) method. Simulation results indicate that the periodic micro-/nano-structures formed in the eutectic binary alloy films after or during irradiation of a laser beam will result in a prominent near field enhancement and may be the origin of the higher signal-to-noise ratio (SNR) in super-RENS optical disk.