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中文摘要：
采用射频磁控溅射法在玻璃基片上制备了Nd（Tb，Dy）Co／Cr薄膜．X射线衍射仪分析结果表明溅射制得的Nd（Tb，Dy）Co薄膜为非晶结构．振动样品磁强计（VSM）测试结果显示NdTbCo薄膜垂直膜面方向矫顽力与剩磁矩形比分别达到308．8kA／m和0．732，而平行膜面方向矫顽力与剩磁矩形比分别仅为22．3kA／m和0．173，这表明NdTbCo薄膜具有垂直磁各向异性．随着Nd掺杂量的增加，Nd（Tb，Dy）Co薄膜的矫顽力逐渐降低，克尔旋转角与反射率则逐渐升高．（Nd，Tb1-x）31Co69的克尔旋转角和反射率分别从x=0的0．2720°，0．2616，上升到x=0．338的0．3258°，0．3320．（NdxDy1-x）33Co67的克尔旋转角和反射率分别从x=0．210的0．2761°，0．3054，上升到了x=0.321的0．3231°，0．3974．Nd掺杂量对克尔旋转角的影响可用Nd（Tb，Dy）Co的亚铁磁结构进行解释．
英文摘要：
Thin films of Nd（Tb,Dy）Co/Cr were prepared onto glass substrate by RF magnetron sputtering and amorphous shown by X-ray diffraction （XRD）. The results from vibrating sample magnetometer（VSM） measurement revealed that NdTbCo thin films had perpendicular magnetic anisotropy. The perpendicular coercivity and remanence square ratio reached 308.8 kA/m and 0. 732 respectively, and the inplanar coercivity and remanence square ratio were only 22.3 kA/m and 0. 173 respectively. With the addition of Nd, the coercivity decreased gradually, while kerr rotation angle and reflectivily increased step by step. When x increased from 0 to 0. 338, kerr rotation angle and reflectivity of （NdxTb1-x）31Co69 thin films increased from 0. 272 0°, 0. 261 6 to 0. 325 8°, 0. 332 0 respectively. When x increased from 0. 210 to 0. 321, kerr rotation angle and reflectivity of （NdxDy1-x）33 Co67 thin films increased from 0. 276 1°, 0. 305 4 to 0. 323 1°,0. 397 4 respectively. The effect of Nd addition on kerr rotation angle was explained by the ferrimagnetic structure of Nd（Tb,Dy）Co.
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