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Parameter Extraction of Nano-Scale MOSFET by Forward Gated-Diode Method
  • ISSN号：1546-1955
  • 期刊名称：Journal of Computational and Theoretical Nanoscien
  • 时间：2012
  • 页码：1581-1585
  • 相关项目：纳米CMOS器件的可靠性表征技术、失效机理及预测模型研究
作者： Chenfei Zhang|Min Shi|Zhenjuan Zhang, et al.|
同期刊论文项目
纳米CMOS器件的可靠性表征技术、失效机理及预测模型研究
期刊论文 74 会议论文 27
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