EMP injection damage effects of a bipolar transistor and its relationship between the injecting voltage and energy
ISSN号:1674-4926
期刊名称:《半导体学报:英文版》
时间:0
分类:TN78[电子电信—电路与系统] TU895[建筑科学]
作者机构:[1]Key Laboratory of Ministry of Education for Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi 'an 710071, China
相关基金:Project supported by the National Natural Science Foundation of China (No. 60776034).