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Investigation of Tunneling Field Effect Transistor Reliability
  • 所属机构名称：复旦大学
  • 会议名称：10th International Conference on Solid-State and Integrated-Circuit Technology
  • 时间：2010.11.11
  • 成果类型：会议
  • 相关项目：纳米CMOS器件的可靠性表征技术、失效机理及预测模型研究
作者： G. F. Jiao|X. Y. Huang|Z. X. Chen，et al.,|
同会议论文项目
纳米CMOS器件的可靠性表征技术、失效机理及预测模型研究
期刊论文 74 会议论文 27
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