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Field-Based Parasitic Capacitance Models for 2D and 3D sub-45-nm Interconnect
  • 所属机构名称：复旦大学
  • 会议名称：4th Asia Symposium on Quality Electronic Design
  • 时间：2012.7.7
  • 成果类型：会议
  • 相关项目：纳米CMOS器件的可靠性表征技术、失效机理及预测模型研究
作者： Aixi Zhang|Wei Zhao|Xiaoan Zhu|Wanling Deng, et al.|
同会议论文项目
纳米CMOS器件的可靠性表征技术、失效机理及预测模型研究
期刊论文 74 会议论文 27
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