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Effects of mechanical-bending and process-induced stresses on metal effective work function
  • ISSN号：0038-1101
  • 期刊名称：Solid-State Electronics
  • 时间：2013.1
  • 页码：142-146
  • 相关项目：HfMxOy/金属栅界面控制及有效功函数调制机理
作者： Yang, Xiaodong|Chu, Min|Huang, Anping|Thompson, Scott|
同期刊论文项目
HfMxOy/金属栅界面控制及有效功函数调制机理
期刊论文 55 会议论文 3
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