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中文摘要：
在一些测试生成算法中,通过数/模和模/数转换器将模拟系统转换为离散数字系统,使得测试生成和响应分析在数字信号领域进行。提出了一种基于支持向量机（support vector machine,SVM）的模拟测试生成算法,通过SVM解决采样空间的线性分类问题,生成的测试序列可直接作为激励信号作用于被测系统,通过输出响应即可判断是否故障。为了减少计算代价,采用一种非等间距方法压缩脉冲响应采样向量,在降低采样空间维度的同时保证了测试生成的有效性。
英文摘要：
In some methods of test generation,an analog device under test（DUT） is treated as a discrete time digital system by placing it between a digital-to-analog converter（DAC） and an analog-to-digital converter（ADC）.In this way the test patterns and responses can be performed and analyzed in the digital domain.A test generation algorithm based on the support vector machine（SVM） is proposed,and SVM is used for classification.This method uses the test patterns derived from the test generation algorithm as input stimuli,and the samples output responses of the analog DUT are applied for fault detection.In order to reduce the computational cost,this paper uses non-equidistant sampling to compress the impulse-response sample vectors.It ensures the efficiency of test generation when reducing the dimension of the sample space.
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Application of Heuristic Graph Search to Test-Point Selection for Analog Fault Dictionary Techniques
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