讨论基于σ-λ律的Sugeno测度的刻划定理,借助于所提出的刻划定理。给出基于σ-λ律的Sugeno测度可列可加的误差估计及其计算公式。
In this paper, a characteristic theorem for the Sugeno measure based on σ-λ rules is given. By means of the proposed theorem, the calculation and formula of the defect of countable additivity for the Sugeno measure based on σ-λ rules are discussed.