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Cathodoluminescence study on in composition inhomogeneity of thick InGaN layer
  • ISSN号：0040-6090
  • 期刊名称：Thin Solid Films
  • 时间：0
  • 页码：5028-5031
  • 语言：英文
  • 相关项目：位错和点缺陷对日盲型AlGaN紫外探测器性能的影响机理
作者： Yang|Jahn|Jiang|S. M.|Zhang|Z. S.|U.|H.|D. S.|Zhao|Wang|Liu|D. G.|J. J.|Zhu|
同期刊论文项目
位错和点缺陷对日盲型AlGaN紫外探测器性能的影响机理
期刊论文 56 专利 4
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