在多晶硅导电材料的1/f噪声迁移率涨落、载流子数涨落机制和模型的基础上,修正了基于迁移率涨落机制的噪声模型。通过分析材料中载流子输运的实际物理过程,论证了产生1/f噪声的两种机制同时存在于多晶硅材料中,提出建立多晶硅导电材料1/f噪声双机制不同掺杂浓度统一模型的思路。
Based on the mobility fluctuation and carrier number fluctuation mechanisms and 1/f noise models of poly-Si conductive materials,the noise model of mobility fluctuation is revised.By analyzing the actual physical process of carrier transport in materials,we demonstrate that both mechanisms exist in poly-Si conductive materials,and propose a method for developing a unified 1/f noise model of poly-Si conductive materials with double mechanisms and different dopant concentrations.