以金做催化剂,采用化学气相沉积(CVD)方法在Si(100)衬底上生长了整齐紧密排列的ZnO纳米线。XRD图谱上只有ZnO的(002)衍射峰,说明ZnO纳米线沿[001]择优生长;扫描电子显微镜分析表明:ZnO纳米线整齐排列在Si(100)衬底上,直径在100nm左右,平均长度为4μm。研究发现ZnO纳米线的生长机理与传统的V-L-S机理有所不同:生长过程中,在Si(100)衬底上先生长了大约500nm厚的ZnO薄膜,而ZnO纳米线生长在薄膜之上。
Well-aligned ZnO nanowires were synthesized on the Si (001) substrate using Au as catalyzer by chemical vapor deposition (CVD). Only (002) diffraction peaks of ZnO could be found on the XRD patterns,which indicated that the ZnO nanowires exhibited(001 ) preferred orientation. The SEM images show that the average diameters of ZnO nanowires is 100nm and average lengths is 4μm. They were aligned on Si substrate well. The ZnO thin films with thickness of 500nm was deposited on Si substrate firstly and ZnO nanowires grow on the ZnO thin films,which is totally different from V-L-S mechanism.