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Multiregion DCIV: A Sensitive Tool for Characterizing the Si/SiO2 Interfaces in LDMOSFETs
  • ISSN号：0741-3106
  • 期刊名称：IEEE Electron Device Letters
  • 时间：2012.10.10
  • 页码：1435-1437
  • 相关项目：硅基纳米尺度新结构器件
作者： Yandong He|Ganggang Zhang|Lin Han|Xing Zhang|
同期刊论文项目
硅基纳米尺度新结构器件
期刊论文 29 会议论文 15 获奖 4 专利 19
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