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A Simple Circuit to Investigate Threshold Voltage Variation and Its Application in Monitoring Negati
  • ISSN号：0021-4922
  • 期刊名称：Japanese Journal of Applied Physics
  • 时间：2013
  • 页码：04CC06-
  • 相关项目：硅基纳米尺度新结构器件
作者： Jie Hong|Yandong He|Ganggang Zhang|Xing Zhang|
同期刊论文项目
硅基纳米尺度新结构器件
期刊论文 29 会议论文 15 获奖 4 专利 19
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