1.0 μm gate-length InP-based InGaAs high electron mobility transistors by mental organic chemical vapor deposition
ISSN号:1671-4776
期刊名称:《微纳电子技术》
时间:0
分类:TN32[电子电信—物理电子学] TN304.23[电子电信—物理电子学]
作者机构:[1]School of Reliability and System Engineering, Beihang University, B eijing 100191, China, [2]Information & Communication College, Guilin University of Electronic Technology, Guilin 541004, China
相关基金:Project(Z132012A001) supported by the Technical Basis Research Program in Science and Industry Bureau of China; Project(61201028 60876009) supported by the National Natural Science Foundation of China.