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A model for the set statistics of rram inspired in the percolation model of oxide breakdown
  • ISSN号：0741-3106
  • 期刊名称：IEEE Electron Device Letters
  • 时间：2013
  • 页码：999-1001
  • 相关项目：新型微电子器件集成的基础研究
作者： Liu, Ming|Suñ|é|, Jordi|
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新型微电子器件集成的基础研究
期刊论文 98 会议论文 12
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