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Set statistics in conductive bridge random access memory device with Cu/HfO2/Pt structure (vol 105,
  • ISSN号：0003-6951
  • 期刊名称：Applied Physics Letters
  • 时间：2015.4.13
  • 页码：-
  • 相关项目：新型微电子器件集成的基础研究
作者： Lian, Xiaojuan|Miranda, Enrique|Sune, Jordi|Liu, Ming|
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新型微电子器件集成的基础研究
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