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In situ electron holography study of charge distribution in high-k charge-trapping memory
  • ISSN号：2041-1723
  • 期刊名称：Nature Communications
  • 时间：2013.10.12
  • 页码：2764-2764
  • 相关项目：新型微电子器件集成的基础研究
作者： 刘明|
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新型微电子器件集成的基础研究
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