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In situ electron holography study of charge distribution in high-kappa charge-trapping memory
  • ISSN号：2041-1723
  • 期刊名称：Nature Communications
  • 时间：2013.11
  • 页码：-
  • 相关项目：新型微电子器件集成的基础研究
作者： Duan, X. F.|Wang, Y. G.|Gu, L.|Yu, R. C.|
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新型微电子器件集成的基础研究
期刊论文 98 会议论文 12
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