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中文摘要：
通过 WINXCOM理论计算X射线能量在20～100 keV下，钨和铅硅酸盐玻璃的质量衰减系数、有效原子序数和半值层。结果发现，随着 WO3和PbO 含量的增加质量衰减系数增加。钨玻璃在70 keV能量下，由于光电效应发生突变，质量衰减系数突然增强。随后，利用 MCNP 5计算5种能量下钨玻璃的积累因子，以便进一步修正模拟结果以达到真实情况。
英文摘要：
The mass attenuation coefficients,effective atomic number and half-value layer of tungsten and lead silicate glasses have been theoretically calculated for X-rays photon energies of 20～100 keV by WINXCOM program.These results indicate that the total mass attenuation coefficients were increased by increasing WO3 and PbO concentration.Mass attenuation coefficient of tungsten glass suddenly increases at＆amp;nbsp;energy of 70 keV,due to the photoelectric had mutation.Subsequently,the build-up factor of tungsten glass has been calculationed by MCNP 5 at five kinds of energies,so that further amendments to the simulation results in order to achieve real situation.
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